Search

Start Over Keyword SiC

1. STUDY OF DEFECT STRUCTURE AND ELECTRICAL TRANSPORT IN BACK END OF LINE DIELECTRICS AND SIC MOSFETS

open_access
Open Access
Author:
Bittel, Brad
Title:
STUDY OF DEFECT STRUCTURE AND ELECTRICAL TRANSPORT IN BACK END OF LINE DIELECTRICS AND SIC MOSFETS
Graduate Program:
Materials Science and Engineering
Keywords:
magnetic resonance
EPR
low-k
BEOL
SiC
File:
Download thesis_after_defense.pdf
Committee Members:
Patrick M Lenahan, Dissertation Advisor/Co-Advisor
Patrick M Lenahan, Committee Chair/Co-Chair
Suman Datta, Committee Member
Joan Marie Redwing, Committee Member
Jerzy Ruzyllo, Committee Member

2. High Current Density Stability of Ohmic Contacts to Silicon Carbide

open_access
Open Access
Author:
Downey, Brian P
Title:
High Current Density Stability of Ohmic Contacts to Silicon Carbide
Graduate Program:
Materials Science and Engineering
Keywords:
high current
electromigration
Pd
contact
ohmic
SiC
stability
File:
Download BPDowneyDissertation_2011.pdf
Committee Members:
Suzanne E Mohney, Dissertation Advisor/Co-Advisor
Suzanne E Mohney, Committee Chair/Co-Chair
Douglas Edward Wolfe, Committee Member
Patrick M Lenahan, Committee Member
Michael T Lanagan, Committee Member

3. FIELD ASSISTED SINTERING OF SILICON CARBIDE: EFFECTS OF TEMPERATURE, PRESSURE, HEATING RATE, AND HOLDING TIME

open_access
Open Access
Author:
Gephart, Sean Michael
Title:
FIELD ASSISTED SINTERING OF SILICON CARBIDE: EFFECTS OF TEMPERATURE, PRESSURE, HEATING RATE, AND HOLDING TIME
Graduate Program:
Engineering Science
Keywords:
sintering
SiC
silicon carbide
ceramic
spark plasma sintering
field assisted sintering technology
SPS
FAST
File:
Download Final-SG-Thesis.pdf
Committee Members:
Jogender Singh, Thesis Advisor/Co-Advisor
Jogender Singh, Thesis Advisor/Co-Advisor
Anil Kamalakant Kulkarni, Thesis Advisor/Co-Advisor
Ivica Smid, Thesis Advisor/Co-Advisor

5. Electrical Characterization of GaN and SiC Schottky Diodes and Non mechanical beam steering using Liquid Crystals

open_access
Open Access
Author:
Kurhade, Kandhar Kantesh
Title:
Electrical Characterization of GaN and SiC Schottky Diodes and Non mechanical beam steering using Liquid Crystals
Graduate Program:
Electrical Engineering
Keywords:
GaN
SiC
Electrical Characterisation
Schottky Diodes
Liquid Crystals
Beam Steering
File:
Download Kandhar_thesis.pdf
Committee Members:
Jerzy Ruzyllo, Thesis Advisor/Co-Advisor

6. ELECTRONIC TRANSPORT IN SYNTHETIC TRANSITION METAL DICHALCOGENIDES AND NOVEL GRAPHENE/METAL HETEROSTRUCTURES

open_access
Open Access
Author:
Bersch, Brian
Title:
ELECTRONIC TRANSPORT IN SYNTHETIC TRANSITION METAL DICHALCOGENIDES AND NOVEL GRAPHENE/METAL HETEROSTRUCTURES
Graduate Program:
Materials Science and Engineering
Keywords:
Two-dimensional materials
MoS2
WSe2
graphene
2D-Ga
2D-metals
superconducting heterostructures
TMDs
transition metal dichalcogenides
confinement heteroepitaxy
CHet
intercalation
SiC
MOCVD
field-effect transistors
transport
2D superconductors
2D heterostructures
File:
Download Dissertation_Bersch_eTD_final.pdf
Committee Members:
Joshua Alexander Robinson, Dissertation Advisor/Co-Advisor
Joshua Alexander Robinson, Committee Chair/Co-Chair
Suzanne E Mohney, Committee Member
Joan Marie Redwing, Committee Member
Saptarshi Das, Outside Member
John C Mauro, Program Head/Chair

7. Detection of Defects in Silicon Carbide PIN Diodes via Electrically Detected Magnetic Resonance

open_access
Open Access
Author:
Barker, William
Title:
Detection of Defects in Silicon Carbide PIN Diodes via Electrically Detected Magnetic Resonance
Graduate Program:
Engineering Science and Mechanics
Keywords:
Silicon Carbide
Electrically Detected Magnetic Resonance
PIN Diodes
EDMR
EPR
Electron Paramagnetic Resonance
SiC
File:
Download Barker2020_MSThesis.pdf
Committee Members:
Patrick M Lenahan, Thesis Advisor/Co-Advisor
Judith Todd Copley, Program Head/Chair
Mark William Horn, Committee Member
Michael T Lanagan, Committee Member

8. Reliability Studies in Silicon Carbide and Silicon Power MOSFETs

open_access
Open Access
Author:
Ghosh, Amartya
Title:
Reliability Studies in Silicon Carbide and Silicon Power MOSFETs
Graduate Program:
Engineering Science and Mechanics
Keywords:
Wide Band Gap
SiC
Reliability
Device Physics
Interface Traps
Border Traps
File:
Download Final-Revised.pdf
Committee Members:
Samia Suliman, Major Field Member
Jian hsu, Major Field Member
Osama Awadelkarim, Chair & Dissertation Advisor
Jifa Hao, Special Member
Albert Segall, Program Head/Chair
Rongming Chu, Outside Unit & Field Member