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Author:

Won, Hyosig

Title:

THE MEASUREMENTS OF SHEET CONDUCTANCE OF METALLIZED SILICON SURFACE BY TWO POINT TUNNELING PROBE

Graduate Program:

Physics

Keywords:

Scanning Tunneling Microscopy
Scattering
Sheet conductance
Thin Metallic Film
Schottky Barrier
Mean Free Path

File:

Download thesis_final22.pdf

Committee Members:

Roy F Willis, Committee Chair/Co-Chair
Gerald Dennis Mahan, Committee Member
Qi Li, Committee Member
Suzanne E Mohney, Committee Member