1. THE MEASUREMENTS OF SHEET CONDUCTANCE OF METALLIZED SILICON SURFACE BY TWO POINT TUNNELING PROBE Open Access Author: Won, Hyosig Title: THE MEASUREMENTS OF SHEET CONDUCTANCE OF METALLIZED SILICON SURFACE BY TWO POINT TUNNELING PROBE Graduate Program: Physics Keywords: Scanning Tunneling MicroscopyScatteringSheet conductanceThin Metallic FilmSchottky BarrierMean Free Path File: Download thesis_final22.pdf Committee Members: Roy F Willis, Committee Chair/Co-ChairGerald Dennis Mahan, Committee MemberQi Li, Committee MemberSuzanne E Mohney, Committee Member
2. Schottky Contact Metallizations for GaN Restricted (Penn State Only) Author: Clark, Jacob Title: Schottky Contact Metallizations for GaN Graduate Program: Materials Science and Engineering Keywords: GaNGallium NitrideAtomic Layer DepositionSchottky BarrierPhysical Vapor DepositionMolybdenum CarbonitrideSchottky DiodeContactsMetal NitridesMetallization File: Login to Download Committee Members: Suzanne E Mohney, Thesis Advisor/Co-AdvisorPatrick M Lenahan, Committee MemberJohn Mauro, Program Head/ChairRongming Chu, Committee Member
