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1. Exploring Power Reliability Tradeoffs in On-Chip Networks

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Open Access

2. Redundancy and Parallelism Tradeoffs for Reliable, High-Performance Architectures

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Open Access

3. Atomic-Scale Defects Involved in the Negative Bias Temperature Instability in SiO2 and Plasma-Nitrided Oxide Based pMOSFETs

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Open Access

5. DESIGNING ENERGY-EFFICIENT AND RELIABLE CACHES AND INTERCONNECTS

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Open Access

6. The Disability in the Physically Active Scale: The Psychometrics of an Outcome Scale for Musculoskeletal Injuries

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Open Access

7. Addressing Reliability Issues in Performance-Critical Processor Structures

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Open Access

8. Analysis of Failures in Nanoscale Devices

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Open Access

9. Software Based Techniques for Robust Computing on Chip Multiprocessors

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Open Access

10. RATER AGREEMENT AND THE MEASUREMENT OF RELIABILITY IN EVALUATIONS OF ONLINE COURSE DESIGN USING THE QUALITY MATTERS RUBRIC(TM)

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Open Access

12. LOAD AND RESISTANCE FACTOR DESIGN FOR INTEGRAL ABUTMENT BRIDGES

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Open Access

13. A Citation-Based Assessment Of The Performance Of U.S. Boiling Water Reactors Following Extended Power Up-Rates

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Open Access

14. Reliability Based Design of Horizontal Curves Considering the Effects of Grades

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Open Access

15. Reliability and Validity Evidenc for the Confusion, Hubbub, and Order Scale (CHAOS) when used in Rural Homes

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Open Access

16. Sense Of Purpose Inventory: Development, Psychometric examination And Construct Validation

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Open Access

17. Reliability and Aging in Patterned Pb(Zr0.52Ti0.48)O3 Films

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Open Access

18. Generalizability of Direct Behavior Ratings by Trained and Untrained Raters

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Open Access

19. EFFECT OF QUALITY CHARACTERISTICS OF PEER RATER ON THE RELIABILITY AND VALIDITY OF PEER ASSESSMENT

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Open Access

20. ARCHITECTURAL TECHNIQUES TO ENABLE RELIABLE AND HIGH PERFORMANCE MEMORY HIERARCHY IN CHIP MULTI-PROCESSORS

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Open Access

21. Assuring Security and Privacy of Emerging Non-Volatile Memories

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Open Access

22. Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices

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Open Access

23. Reliability Studies in Silicon Carbide and Silicon Power MOSFETs

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Open Access

24. Oxygen Vacancy Dynamics and Their Impact on Reliability of BaTiO3-based Multilayer Ceramic Capacitors

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Restricted (Penn State Only)

25. Grit among Cambodian adolescents: Validity and reliability of the original and short forms of the grit scale

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Open Access