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Author:

Khan, Mohammad Nasim

Title:

Assuring Security and Privacy of Emerging Non-Volatile Memories

Graduate Program:

Electrical Engineering

Keywords:

Non-Volatile Memory
NVM
Security
Privacy
Reliability
Testing
STTRAM
RRAM
PCM
MRAM
FeRAM

File:

Download Assuring_Security_and_Privacy_of_Emerging_Non_Volatile_Memories__1_.pdf

Committee Members:

Swaroop Ghosh, Dissertation Advisor/Co-Advisor
Mehdi Kiani, Committee Member
Vishal Monga, Committee Member
Trent Ray Jaeger, Committee Member
Saptarshi Das, Outside Member
Kultegin Aydin, Program Head/Chair
Swaroop Ghosh, Committee Chair/Co-Chair

Author:

Sharov, Fedor

Title:

Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices

Graduate Program:

Engineering Science and Mechanics

Keywords:

Electrically Detected Magnetic Resonance
Near-Zero-Field Magnetoresistance
Reliability
Metal-Oxide-Semiconductors
Field Effect Transistors
Time Dependent Dielectric Breakdown
Gamma Irradiation
Total Ionizing Dose
Silicon Dioxide
Silicon Carbide
Rapid Scan
Interface Defects

File:

Download Thesis_FVS_Final_jcm6606_2.pdf

Committee Members:

Albert Segall, Program Head/Chair
Sahin Ozdemir, Major Field Member
Suzanne Mohney, Outside Unit & Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Saptarshi Das, Major Field Member

Author:

Ghosh, Amartya

Title:

Reliability Studies in Silicon Carbide and Silicon Power MOSFETs

Graduate Program:

Engineering Science and Mechanics

Keywords:

Wide Band Gap
SiC
Reliability
Device Physics
Interface Traps
Border Traps

File:

Download Final-Revised.pdf

Committee Members:

Samia Suliman, Major Field Member
Jian hsu, Major Field Member
Osama Awadelkarim, Chair & Dissertation Advisor
Jifa Hao, Special Member
Albert Segall, Program Head/Chair
Rongming Chu, Outside Unit & Field Member

Author:

Yousefian, Pedram

Title:

Oxygen Vacancy Dynamics and Their Impact on Reliability of BaTiO3-based Multilayer Ceramic Capacitors

Graduate Program:

Materials Science and Engineering

Keywords:

Multilayer ceramic capacitors (MLCCs)
BaTiO3
Reliability
Oxygen Vacancy
Lifetime Prediction
Machine Learning
Common Cause Failure
HALT
TSDC

File:

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Committee Members:

John Mauro, Program Head/Chair
Susan Trolier-McKinstry, Major Field Member
John Mauro, Major Field Member
Clive Randall, Chair & Dissertation Advisor
Yang Yang, Outside Unit & Field Member

Author:

Apsley, Hannah

Title:

Grit among Cambodian adolescents: Validity and reliability of the original and short forms of the grit scale

Graduate Program:

Human Development and Family Studies

Keywords:

Cambodia
Adolescent
Grit
Validity
Reliability
Factor Analysis

File:

Download Grit_Measurement_Thesis_Final_Version_v2.pdf

Committee Members:

Hobart H Cleveland, III, Thesis Advisor/Co-Advisor
Alexis R Santos, Committee Member
Charles Geier, Professor in Charge/Director of Graduate Studies