1. Magnetic Resonance in a Wafer Probing Station Open Access Author: Mc Crory, Duane Title: Magnetic Resonance in a Wafer Probing Station Graduate Program: Engineering Science and Mechanics Keywords: Electrically Detected Magnetic ResonanceSemiconductorsSemiconductor ReliabilityRapid Scan EDMRSpatially Resolved EDMRElectrically Detected Electron Nuclear Double Resonance File: Download McCrory_PhD_Thesis_FINAL.pdf Committee Members: Patrick M Lenahan, Dissertation Advisor/Co-AdvisorPatrick M Lenahan, Committee Chair/Co-ChairJerzy Ruzyllo, Committee MemberSaptarshi Das, Committee MemberMichael T Lanagan, Outside Member