1. Reliability and Power Analysis of FinFET-based FPGAs Open Access Author: Mushtaq, Muhammad Umar Title: Reliability and Power Analysis of FinFET-based FPGAs Graduate Program: Computer Science and Engineering Keywords: FPGAFinFETSoft-ErrorProcess VariationsSub-Threshold LeakageIndependent Gate Control File: Download muhammad_umar_mushtaq_thesis.pdf Committee Members: Yuan Xie, Thesis Advisor/Co-Advisor
2. Addressing Reliability Issues in Performance-Critical Processor Structures Open Access Author: Soundararajan, Niranjan Kumar Title: Addressing Reliability Issues in Performance-Critical Processor Structures Graduate Program: Computer Science and Engineering Keywords: MicroprocessorReliabilitySoft ErrorsProcess VariationsWearoutFault Tolerance File: Download Niranjan_Dissertation.pdf Committee Members: Vijaykrishnan Narayanan, Dissertation Advisor/Co-AdvisorAnand Sivasubramaniam, Committee Chair/Co-ChairVijaykrishnan Narayanan, Committee Chair/Co-ChairMary Jane Irwin, Committee MemberYuan Xie, Committee MemberSuman Datta, Committee Member
3. Toward Low Power and Reliable FPGA Design Open Access Author: Srinivasan, Suresh Title: Toward Low Power and Reliable FPGA Design Graduate Program: Computer Science and Engineering Keywords: Soft ErrorsLeakage PowerPermanent FailuresFPGAsProcess Variations File: Download Suresh-Dissertation.pdf Committee Members: Vijaykrishnan Narayanan, Committee Chair/Co-ChairMary Jane Irwin, Committee MemberYuan Xie, Committee MemberVittaldas V Prabhu, Committee Member
