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Author:

Lin, Ing-Chao

Title:

System Level Power and Reliability Modeling

Graduate Program:

Computer Science and Engineering

Keywords:

System-on-Chip
SoC
TLM
Device Degradation Modeling
Power Modeling
Negative Bias Temperature Instability
Hot Carrier Effect
NBTI
Reliability Modeling
HCE
Transaction level modeling
Bus-based
PCI Express

File:

Download ingchao_final.pdf

Committee Members:

Vijaykrishnan Narayanan, Committee Chair/Co-Chair
Mary Jane Irwin, Committee Member
Yuan Xie, Committee Member
W Kenneth Jerkins, Committee Member
Nagu Dhanwada, Committee Member

Author:

Campbell, Jason P

Title:

Atomic-Scale Defects Involved in the Negative Bias Temperature Instability in SiO2 and Plasma-Nitrided Oxide Based pMOSFETs

Graduate Program:

Engineering Science and Mechanics

Keywords:

Negative Bias Temperature Instability
Spin-Dependent Recombination
Spin-Dependent Tunneling
Atomic-Scale Defects
Reliability

File:

Download Campbell_PhDThesis_Final.pdf

Committee Members:

Patrick M Lenahan, Committee Chair/Co-Chair
S Ashok, Committee Member
Jerzy Ruzyllo, Committee Member
Michael T Lanagan, Committee Member
Tara Krishnan, Committee Member

Author:

Myers, Kenneth

Title:

Novel Techniques and Modern Applications of Electrically Detected Magnetic Resonance Spectroscopy and Near-Zero-Field Magnetoresistance

Graduate Program:

Materials Science and Engineering

Keywords:

Semiconductors
Electrically Detected Magnetic Resonance
Near Zero Field Magnetoresistance
Electron Paramagnetic Resonance
Electron Nuclear Double Resonance
Deep Level Transient Spectroscopy
Silicon
Silicon Dioxide
Negative Bias Temperature Instability
FinFET
Hafnium Dioxide
Amorphous Boron

File:

Download Kenneth_Myers_Thesis_Final4.pdf

Committee Members:

Suzanne Mohney, Outside Unit & Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Mark Horn, Major Field Member
Saptarshi Das, Major Field Member
John Mauro, Program Head/Chair