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1. Exploring Atomic-Scale Defects Related to Time-Dependent Dielectric Breakdown with Spin-Dependent Measurements

open_access
Open Access
Author:
Moxim, Stephen
Title:
Exploring Atomic-Scale Defects Related to Time-Dependent Dielectric Breakdown with Spin-Dependent Measurements
Graduate Program:
Engineering Science and Mechanics
Keywords:
Electron Paramagnetic Resonance
Electrically Detected Magnetic Resonance
Near-Zero-Field Magnetoresistance
Time-Dependent Dielectric Breakdown
Atomic-Scale Defects
Semiconductor
File:
Download Moxim_Dissertation_Final_Corrected.pdf
Committee Members:
Venkatraman Gopalan, Outside Unit & Field Member
Sahin Ozdemir, Major Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Saptarshi Das, Major Field Member
Albert Segall, Program Head/Chair

2. Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices

open_access
Open Access
Author:
Sharov, Fedor
Title:
Applications of Electrically Detected Magnetic Resonance to the Analysis of Technologically Relevant Reliability Mechanisms in Semiconductor Devices
Graduate Program:
Engineering Science and Mechanics
Keywords:
Electrically Detected Magnetic Resonance
Near-Zero-Field Magnetoresistance
Reliability
Metal-Oxide-Semiconductors
Field Effect Transistors
Time Dependent Dielectric Breakdown
Gamma Irradiation
Total Ionizing Dose
Silicon Dioxide
Silicon Carbide
Rapid Scan
Interface Defects
File:
Download Thesis_FVS_Final_jcm6606_2.pdf
Committee Members:
Albert Segall, Program Head/Chair
Sahin Ozdemir, Major Field Member
Suzanne Mohney, Outside Unit & Field Member
Patrick Lenahan, Chair & Dissertation Advisor
Saptarshi Das, Major Field Member