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Author:

Lerach, Jordan Oswald

Title:

Strong-field ionization applied to sputtered neutral molecules from varied chemical environments

Graduate Program:

Chemistry

Keywords:

SIMS
Mass Spectrometry
Laser post ionization
depth profile
C60
secondary ion
secondary neutral mass spectrometry
laser

File:

Download Jordan_Lerach_Disseration.pdf

Committee Members:

Nicholas Winograd, Dissertation Advisor/Co-Advisor
Barbara Jane Garrison, Committee Member
John B Asbury, Committee Member
Matthew Scott Fantle, Committee Member