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1. Strong-field Photoionization of Sputtered Neutral Molecules for Chemical Imaging and Depth Profiling

open_access
Open Access
Author:
Willingham, David G
Title:
Strong-field Photoionization of Sputtered Neutral Molecules for Chemical Imaging and Depth Profiling
Graduate Program:
Chemistry
Keywords:
ToF-SIMS
Laser Photoionization
Chemical Imaging
Depth Profiling
File:
Download Thesis-FinalB.pdf
Committee Members:
Nicholas Winograd, Dissertation Advisor/Co-Advisor
Nicholas Winograd, Committee Chair/Co-Chair
Albert Welford Castleman Jr., Committee Member
Renee Denise Diehl, Committee Member
Barbara Jane Garrison, Committee Member

2. MOLECULAR DEPTH PROFILING AND WEDGE-CRATER BEVELING WITH TOF-SIMS AND CLUSTER ION BEAMS

open_access
Open Access
Author:
Mao, Dan
Title:
MOLECULAR DEPTH PROFILING AND WEDGE-CRATER BEVELING WITH TOF-SIMS AND CLUSTER ION BEAMS
Graduate Program:
Chemistry
Keywords:
Depth Profiling
Cluster Ion Beams
TOF-SIMS
File:
Download Dan_Thesis.pdf
Committee Members:
Nicholas Winograd, Dissertation Advisor/Co-Advisor
Nicholas Winograd, Committee Chair/Co-Chair
Christine Dolan Keating, Committee Member
Tae Hee Lee, Committee Member
John H Golbeck, Committee Member