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Author:

Yang, Jung In

Title:

Reliability and Aging in Patterned Pb(Zr0.52Ti0.48)O3 Films

Graduate Program:

Materials Science and Engineering

Keywords:

Ferroelectric
Reliability
Aging
HALT
Conduction mechanism
Patterned PZT thin film

File:

Download Final_thesis_Jung_In.pdf

Committee Members:

Susan E Trolier-Mckinstry, Dissertation Advisor/Co-Advisor
Susan E Trolier-Mckinstry, Committee Chair/Co-Chair
Clive A Randall, Committee Member
Venkatraman Gopalan, Committee Member
Srinivas A Tadigadapa, Outside Member