1. Developing molecular depth profiling and dynamic imaging with TOF-SIMS and cluster ion beams Open Access Author: Cheng, Juan Title: Developing molecular depth profiling and dynamic imaging with TOF-SIMS and cluster ion beams Graduate Program: Chemistry Keywords: TOF-SIMSmolecular depth profilingcluster ion beams3-d imaging File: Download final_pdf.pdf Committee Members: Nicholas Winograd, Committee Chair/Co-ChairBlake R Peterson, Committee MemberAnne M Andrews, Committee MemberMichael Pishko, Committee Member
