eTD Explore

Start Over Year 2009 Committee Member Joseph Paul Cusumano Committee Member Osama O Awadelkarim Committee Member Samia A Suliman Keyword reliability

Open Access

Author:: Passmore, Lucas Jay
Title:: Development of a Complimentary Suite of Characterization Tools for the Analysis of MOS Device Degradation Using Dynamic Stimuli
Graduate Program:: Engineering Science and Mechanics
Keywords:: semiconductor
pca
health monitoring
mosfet
reliability
mos
dynamic
File:: Download Passmore_Dissertation.pdf
Committee Members:: Osama O Awadelkarim, Dissertation Advisor/Co-Advisor
Osama O Awadelkarim, Committee Chair/Co-Chair
Joseph Paul Cusumano, Committee Chair/Co-Chair
Samia A Suliman, Committee Member
Jerzy Ruzyllo, Committee Member

Search