Search

Start Over Graduate Program Electrical Engineering Year 2015 Committee Member Jerzy Ruzyllo Committee Member Vijaykrishnan Narayanan Keyword device-circuit interaction Keyword soft error reliability

1. Device Circuit Interactions for Steep Switching Slope Devices

open_access
Open Access
Author:
Liu, Huichu
Title:
Device Circuit Interactions for Steep Switching Slope Devices
Graduate Program:
Electrical Engineering
Keywords:
Tunneling-field-effect-transistor
device-circuit interaction
steep subthreshold slope
energy efficiency
soft error reliability
File:
Download Ph.D_Thesis_Huichu_Liu-Final_1-12_2.pdf
Committee Members:
Vijaykrishnan Narayanan, Committee Chair/Co-Chair
Suman Datta, Committee Chair/Co-Chair
Jerzy Ruzyllo, Committee Member
Joshua Alexander Robinson, Committee Member

Limit your search