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1. Fundamental Studies of Molecular Depth Profiling with ToF-SIMS and Cluster Ions

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2. Strong-field Photoionization of Sputtered Neutral Molecules for Chemical Imaging and Depth Profiling

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3. NEW DEVELOPMENTS FOR CLUSTER ION BEAMS IN SECONDARY ION MASS SPECTROMETRY IMAGING EXPERIMENTS

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4. LIPID CHARACTERIZATION WITH TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS)

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5. Investigating Lipid Heterogeneity in Single Cells Using Secondary Ion Time-of-Flight Mass Spectrometry

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6. USING TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY TO INVESTIGATE BEHAVIOR OF VAPOR-DEPOSITED METAL ON ALKANETHIOL SELF-ASSEMBLED MONOLAYERS

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7. The Design, Synthesis, and Evaluation of Polyphosphazenes for Hard Tissue Engineering

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8. Molecular Depth Profiling and Chemical Imaging with Cluster ToF-SIMS

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Open Access

9. FUNCTIONALIZATION AND CHARACTERIZATION OF TUNGSTEN DISULFIDE WITH 2-AMINOETHANETHIOL

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Open Access