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Author:

Mukherjee, Debangshu

Title:

Metrology of Ferroelectric Domain Walls with Scanning Transmission Electron Microscopy

Graduate Program:

Materials Science and Engineering

Keywords:

scanning transmission electron microscopy
domain walls
complex oxide
metrology
ferroelectrics

File:

Download DM_Thesis.pdf

Committee Members:

Nasim Alem, Dissertation Advisor/Co-Advisor
Nasim Alem, Committee Chair/Co-Chair
Venkatraman Gopalan, Committee Member
Roman Engel-Herbert, Committee Member
Vincent Henry Crespi, Outside Member
James Rondinelli, Special Member